Journal article
The Journal of Physical Chemistry C, vol. 117, 2013, pp. 24851-24857
APA
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Zoellner, M. H., Niu, G., Jhang, J.-H., Schaefer, A., Zaumseil, P., Bäumer, M., & Schroeder, T. (2013). Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Raman Study. The Journal of Physical Chemistry C, 117, 24851–24857. https://doi.org/10.1021/jp4082867
Chicago/Turabian
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Zoellner, Marvin Hartwig, Gang Niu, Jin-Hao Jhang, Andreas Schaefer, Peter Zaumseil, Marcus Bäumer, and Thomas Schroeder. “Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-Ray Diffraction, X-Ray Photoelectron Spectroscopy, and Raman Study.” The Journal of Physical Chemistry C 117 (2013): 24851–24857.
MLA
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Zoellner, Marvin Hartwig, et al. “Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-Ray Diffraction, X-Ray Photoelectron Spectroscopy, and Raman Study.” The Journal of Physical Chemistry C, vol. 117, 2013, pp. 24851–57, doi:10.1021/jp4082867.
BibTeX Click to copy
@article{zoellner2013a,
title = {Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Raman Study},
year = {2013},
journal = {The Journal of Physical Chemistry C},
pages = {24851-24857},
volume = {117},
doi = {10.1021/jp4082867},
author = {Zoellner, Marvin Hartwig and Niu, Gang and Jhang, Jin-Hao and Schaefer, Andreas and Zaumseil, Peter and Bäumer, Marcus and Schroeder, Thomas}
}